Amorphous-to-crystalline phase transition of (InTe)(GeTe) thin films
Tue, 2010-07-27 19:00 — Guest
Ki-Ho Song, Seung-Cheol Beak, and Hyun-Yong Lee
The crystallization speed (v) of the amorphous (InTe)(GeTe) (x=0.1, 0.3, and 0.5) films and their thermal, optical, and electrical behaviors were investigated by using a nanopulse scanner (wavelength=658 nm, laser beam diameter <2 [mu]m), x-ray diffraction, a four-point probe, and a UV-vis-IR spec ... [J. Appl. Phys. 108, 024506 (2010)] published Tue Jul 27, 2010.
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